Eclipse L300N Series – FPD/LSI inspection microscopes

Featuring Nikon's most advanced optics for unparalleled inspection of the latest wafer types.
Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.

Applications

• Antennae
• Telecom & Electronics
• Telescope optics
• Mobile phones, shavers & watches