Industrial Leading Detector Technology the New Features in Nikon XT H 225ST 2x
3rd unique new feature: Industrial leading detector technology
Nikon Metrology uses an industry-leading flat panel detector, which offers small pixel sizes and fast exposures.
However, the advanced features of the panel technology can only be leveraged when matched with a compatible microfocus X-ray source.
The XT H 225 ST 2x delivers that compatibility, resulting in ultra- fast data acquisition
due to the high power generated from the Rotating.Target 2.0, which allows the detector to operate at its fastest exposure times.
Datasets are of high quality and resolution due to the small focal spot size at high X-ray powers in combination with the detector’s small pixel size and large area.
For further information, please contact as below;
Industrial Instruments Division
Hollywood International Ltd.
Tel. 02-653-8555, 02-653-8255, 02-251-6023 (30 lines) Ext. 710,712,720,727, 728 and 729