TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View® measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
Small footprint with expanded capability
Benefit from the optional ECT Environmental Compensation Technology, securing reliable and accurate measurement results even in noisy and challenging production environments. Micro.View®
is the cost-effective quality control instrument for inspecting precision engineered surfaces in both manufacturing and research.
For further information, please contact as below;
Industrial Instruments Division
Hollywood International Ltd.
Tel. 02-653-8555, 02-653-8255, 02-251-6023 (30 lines) Ext. 710,712,720,727, 728 and 729