XT H 320

XT H 320 for X-ray and CT inspection of larger samples

nikon metrology xray ct computed tomography XTH320The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320 kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.

With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span

Benefits

  • Proprietary 320 kV microfocus X-ray source
  • Run highly accurate inspection on dense industrial objects
  • Easy system operation and low cost-of-ownership
  • Stunning images providing great insight
  • High performance image acquisition and volume processing
  • Straightforward inspection automation
  • Safety first

Applications

  • Fault detection and failure analysis
  • Assembly inspection of complex mechanisms
  • Dimensional measurement of internal components
  • Part-to-CAD comparison
  • Advanced material research
  • Analysis of the biological structures
  • Digital archiving of models
 
Benefits & features
 

nikon metrology xray ct computed tomography XTH320 sourceSuperior accuracy and performance through proprietary 225 or 320kV micro-focus X-ray source

The default 225 kV microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability.

The 320 kV microfocus source is used to penetrate through larger or denser samples.

Regardless of the target of choice, the XT H large cabinet system uses an open-tube X-ray source that guarantees a lower cost-of-ownership


nikon metrology xray ct computed tomography XTH320 rotating reflectionRotating reflection target multiplies X-ray flux

Traditional X-ray sources using fixed targets can only receive a limited flux of electrons to avoid damaging the target. By introducing a rotating reflection target that yields much better cooling performance, the electron flux on the rotating target radically increases without the risk for permanent damage. This boosts X-ray flux by a large factor, and enables customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
By establishing up to 5 times more X-ray flux, customers can either speed up data acquisition by a similar factor or increase data accuracy by taking more radiographs in the same time.


Stunning images from internal structures

A small spot size and a high-resolution flat panel create sharp images.  Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.

nikon metrology xray ct computed tomography XTH225ST materials


nikon metrology xray ct computed tomography XTH320 accessibilityEasy access to inspect larger parts

The XT H 320 systems feature a large access door and the heavy-duty precision 5-axis manipulator can hold samples in excess of 50 kg with dimensions of 0.6 m (H) x 0.6 m (D).


Safety first

Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation


nikon metrology xray ct computed tomography XTH320 accuracy and performanceConfigure the system to your specific needs

Specific applications require more detailed images or higher accuracy. XT H 320 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.

 
Specifications
Microfocus source       Max. kV Max. power Focal spot size Focal spot size  at max power
225 kV Reflection target basic configuration 225 kV 225 W 3 µm up to 7 W 225 µm at 225 W
225 kV Rotating target option alternative configuration 225 kV 450 W 10 µm up to 30 W 160 µm at 450 W
320 kV Reflection target  basic configuration 320 kV 320 W 30 µm up to 30 W  320 µm at 320 W 

 

Detectors # Bits Active pixels Pixel Size Max. frame rate
at 1x1 binning
Max. frame rate
at 2x2 binning
Perkin Elmer 1611 alternative configuration 16-bit 4000 x 4000 100 µm 3.75 fps  7.5 fps
Perkin Elmer 1620  alternative configuration 16-bit 2000 x 2000 200 µm 3.75 fps  7.5 fps
Perkin Elmer 1621 EHS  alternative configuration 16-bit 2000 x 2000 200 µm 15 fps 30 fps


basic configuration: Basic configuration
alternative configuration
: Alternative configuration
 

Manipulator  
# Axes 4 (optional 5th axis)

Axes travel

(Typical values - Exact values depend on system configuration)

(X) 500 mm
(Y) 610 mm
(Z) 800 mm
(Rotate) n*360
Max. sample weight 100 kg

 

General   
Cabinet dimensions (LxWxH) 2695 mm x 1828 mm x 2249 mm
Weight 8,500 kg
Safety All systems are manufactured to IRR99
Control software  All systems are controlled by Nikon Metrology’s in-house Inspect-X software 

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