The New SWIR Solution For Your Production
Normal visible light wavelength ranges from 380 ~ 780 nanometers (nm), where humans can respond to or see. SWIR light is invisible or nonvisible with a wavelength of 1000 ~ 1700 nm. Wavelengths longer than visible wavelengths can only be seen by special sensors. Images generated by the SWIR camera allow you to see through what human eyes cannot.
ViTrox SWIR solutions are designed with a Military-grade camera to provide high-definition vision inspection results. It can inspect inner defects such as inner cracks, component missing, delamination, chip-off &, etc. within the package devices especially WLCSP which is unachievable by using standard solutions.
Today, we would like to introduce a SWIR solution that will solve your trouble during the wafer manufacturing process. Defects such as cracks or chipping can easily be found inside or between wafers, so the quality of the camera to inspect the imperfections is very important. Instead of using standard cameras that can examine only the defects on the top of a wafer, SWIR cameras can do more! Images produced by the SWIR solution allow you to see through the silicon and detect cracks, voids, or other defects.
Contact for more information at
Industrial Instruments Division
Hollywood International Ltd.
Tel : 02-653-8555, 02-653-8255, 02-251-6032 (30 lines) ต่อ 710, 712, 715, 720, 727, 728, 729
E-mail : inds@hollywood.co.th
www.hollywood.co.th
ViTrox SWIR solutions are designed with a Military-grade camera to provide high-definition vision inspection results. It can inspect inner defects such as inner cracks, component missing, delamination, chip-off &, etc. within the package devices especially WLCSP which is unachievable by using standard solutions.
Today, we would like to introduce a SWIR solution that will solve your trouble during the wafer manufacturing process. Defects such as cracks or chipping can easily be found inside or between wafers, so the quality of the camera to inspect the imperfections is very important. Instead of using standard cameras that can examine only the defects on the top of a wafer, SWIR cameras can do more! Images produced by the SWIR solution allow you to see through the silicon and detect cracks, voids, or other defects.
Contact for more information at
Industrial Instruments Division
Hollywood International Ltd.
Tel : 02-653-8555, 02-653-8255, 02-251-6032 (30 lines) ต่อ 710, 712, 715, 720, 727, 728, 729
E-mail : inds@hollywood.co.th
www.hollywood.co.th