Nikon’s innovative Tilted CT is an X-ray Laminography Inspection method that uses an angled axis of rotation by allowing the axis of rotation to be adjusted by up to 30 degrees, which means the sample can fully rotate beneath the X-ray source. Higher magnification and enhanced image clarity are achieved in faster scan times when examining, for example, printed circuit board assemblies. The other principal advantage of the technique is its ability to eliminate artifacts caused by high-density features in specimen-obscuring areas where X-ray attenuation is lower by tilting the axis of rotation.
 
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