The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320 kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.
With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
The default 225 kV microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability.
The 320 kV microfocus source is used to penetrate through larger or denser samples.
Regardless of the target of choice, the XT H large cabinet system uses an open-tube X-ray source that guarantees a lower cost-of-ownership
Traditional X-ray sources using fixed targets can only receive a limited flux of electrons to avoid damaging the target. By introducing a rotating reflection target that yields much better cooling performance, the electron flux on the rotating target radically increases without the risk for permanent damage. This boosts X-ray flux by a large factor, and enables customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
By establishing up to 5 times more X-ray flux, customers can either speed up data acquisition by a similar factor or increase data accuracy by taking more radiographs in the same time.
A small spot size and a high-resolution flat panel create sharp images. Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.
The XT H 320 systems feature a large access door and the heavy-duty precision 5-axis manipulator can hold samples in excess of 50 kg with dimensions of 0.6 m (H) x 0.6 m (D).
Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation
Specific applications require more detailed images or higher accuracy. XT H 320 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.
Microfocus source | Max. kV | Max. power | Focal spot size | Focal spot size at max power |
---|---|---|---|---|
225 kV Reflection target | 225 kV | 225 W | 3 µm up to 7 W | 225 µm at 225 W |
225 kV Rotating target option | 225 kV | 450 W | 10 µm up to 30 W | 160 µm at 450 W |
320 kV Reflection target | 320 kV | 320 W | 30 µm up to 30 W | 320 µm at 320 W |
Detectors | # Bits | Active pixels | Pixel Size | Max. frame rate at 1x1 binning |
Max. frame rate at 2x2 binning |
---|---|---|---|---|---|
Perkin Elmer 1611 | 16-bit | 4000 x 4000 | 100 µm | 3.75 fps | 7.5 fps |
Perkin Elmer 1620 | 16-bit | 2000 x 2000 | 200 µm | 3.75 fps | 7.5 fps |
Perkin Elmer 1621 EHS | 16-bit | 2000 x 2000 | 200 µm | 15 fps | 30 fps |
: Basic configuration
: Alternative configuration
Manipulator | |
---|---|
# Axes | 4 (optional 5th axis) |
Axes travel (Typical values - Exact values depend on system configuration) |
(X) 500 mm (Y) 610 mm (Z) 800 mm (Rotate) n*360 |
Max. sample weight | 100 kg |
General | |
---|---|
Cabinet dimensions (LxWxH) | 2695 mm x 1828 mm x 2249 mm |
Weight | 8,500 kg |
Safety | All systems are manufactured to IRR99 |
Control software | All systems are controlled by Nikon Metrology’s in-house Inspect-X software |