TopMap Micro.View (TMS1400)
Table-top optical surface profiler
TopMap Micro.View® is an easy-to-use and compact optical profiler.
Combine exceptional performance and affordability with this powerful metrology solution.
With an extended 100 mm Z measurement range
and the CST Continuous Scanning Technology,
Micro.View® measures complex topographies at nm resolution.
This convenient table-top setup features integrated electronics,
with the smart focus finder simplifying and speeding up the measurement procedure.
Small footprint with expanded capability
The optional ECT Environmental Compensation Technology,
securing reliable and accurate measurement results even
in noisy and challenging production environments.
Micro.View® is the cost-effective quality control instrument
for inspecting precision-engineered surfaces in both manufacturing and research.