Max kv | 160 kV |
---|---|
Power rating | 20 W (radiography), 10 W (CT)1 |
X-ray source | Open tube transmission target |
Focal spot size | 1 µm1 (below 2 W) |
Defect recognition capability | 500 nm |
Geometric magnification | 2,046x |
System magnification | Up to 36,000x |
Imaging system (Option) | Varex 1515DX (1.3 Mpixel, 16-bit) Flatpanel Varex 2520DX (2.85 Mpixel, 16-bit) Flatpanel Varex 1512 (2.85 Mpixel, 14-bit) Flatpanel |
Manipulator | 5-axis (X, Y, Z, T, R) |
Rotate axis | Included |
Tilt | 0 - 72 degrees |
Measuring volume | Largest square in single map 406x406 mm (16x16") Maximum physical sample size 711x762 mm (28x30") |
Max. sample weight | 5 kg (11 lbs) |
Monitor | Single 4k IPS (3840x2160 pixels) |
Cabinet dimensions (WxDxH ) |
1200 x 1786 x 1916 mm (48.0x71.3x75.4") |
Weight | 2.100 kg (4,692 lbs) |
Radiation safety | <1μSv/hr at the cabinet surface |
Control | Inspect-X control and analysis software |
Automated inspection | Included |
Computed Tomography | Optional CT and/or X.Tract |
Primary applications | Real-time and automated electronics and semiconductor inspection, failure analysis (BGA, μBGA, flip-chip and loaded PCB boards) |